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二碲化鎢晶體 WTe2(Tungsten Ditelluride)
晶體尺寸：10毫米
電學性能：半金屬，type II Weyl semimetal (WSM)
晶體結構：斜方晶系 P
晶胞參數：a = 0.348 nm, b = 0.625 nm, c = 1.405 nm, α = β = γ = 90°
晶體類型：合成
晶體純度：＞99.995%
屬性：半導體
X-ray diffraction on a WTe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8, 10
Powder X-ray diffraction (XRD) of a single crystal WTe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal WTe2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal WTe2. Measurement was performed with a 785 nm Raman system at room temperature.
聯系人：陳谷一
地址：江蘇省泰州市鳳凰西路168號
郵箱：taizhou@sunano.com.cn
電話：021-56830191
